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US9728474B1 - Semiconductor chips with seal rings and electronic test structures, semiconductor wafers including the semiconductor chips, and methods for fabricating the same - Google Patents
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Figure 3 from Plasma inducted wafer arcing in back-end process and the impact on reliability | Semantic Scholar
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PDF] Investigation on seal-ring rules for IC product reliability in 0.25-mum CMOS technology | Semantic Scholar
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Transistors With Electrically Active Chip Seal Ring And Methods Of Manufacture SHIBIB; M. Ayman ; et al. [Siliconix Incorporated]
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SEMICONDUCTOR CHIP, SEAL-RING STRUCTURE AND MANUFACTURING PROCESS THEREOF - diagram, schematic, and image 02
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PDF] Investigation on seal-ring rules for IC product reliability in 0.25-mum CMOS technology | Semantic Scholar
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Guard rings: Structures, design methodology, integration, experimental results, and analysis for RF CMOS and RF mixed signal BiCMOS silicon germanium technology - ScienceDirect
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